normalized units, typically with a value of 1 at +25癈, it
is possible to multiply the curve by the drain voltage at
+25癈 and convert the curve to drain voltage. Now
compare this curve to that of the MAX5938 normalized
tempco of the circuit-breaker threshold to make a
determination of the tracking error in mV between the
power MOSFET [I
D,MOSFET
x R
DS(ON)
] and the
MAX5938 [I
CB_ADJ
(礎) x (2k& + R
CB_ADJ
)] over the
operating temperature range of the application.
If the tempco of the power MOSFET is greater than the
MAX5938s, then additional margin in setting the circuit-
breaker and short-circuit voltages will be required at
higher temperatures as compared to +25癈 (Figure 15).
When dissipation in the power MOSFET is expected to
lead to local temperature elevation relative to ambient
conditions, it becomes imperative that the MAX5938 be
located as close as possible to the power MOSFET. The
marginal effect of temperature differences on circuit-
breaker and short-circuit voltages can be estimated
from a comparative plot such as Figure 14.
Selecting a Resistor and Capacitor
for Step Monitor
When a positive V
IN
step or ramp occurs, the V
IN
increase results in a voltage rise at both STEP_MON
and V
OUT
relative to V
EE
. When the voltage at
STEP_MON is above STEP
TH
, the MAX5938 blocks
short-circuit and circuit-breaker faults. During this
STEP_MON high condition, if V
OUT
rises above V
SC
, the
MAX5938 will immediately and very rapidly pull GATE to
V
EE
. This turns off the power MOSFET to avoid inrush
current spiking. GATE is held low for 350祍. About 1ms
after the start of GATE pulldown, the MAX5938 begins to
ramp GATE up to turn on the MOSFET in a controlled
manner that results in ramping V
OUT
down to the new
supply level (see the GATE Cycles section in Appendix
A). This occurs with the least possible disturbance to
V
OUT
, although during the brief period that the MOSFET
is off, the voltage across the load droops slightly
depending on the load current and load storage capaci-
tance. PGOOD remains asserted throughout the V
IN
step event.
The objective in selecting the resistor and capacitor for
the step monitor function is to ensure that the V
IN
steps
of all anticipated slopes and magnitudes will be proper-
ly detected and blocked, which otherwise would result
in a circuit-breaker or short-circuit fault. The following is
a brief analysis for finding the resistor and capacitor.
For a more complete analysis, see Appendix B.
-48V Hot-Swap Controller with V
IN
Step Immunity,
No R
SENSE
, and Overvoltage Protection
16   ______________________________________________________________________________________
Figure 14. MAX5938 Normalized Circuit Breaker
NORMALIZED MOSFET ON-RESISTANCE
vs. TEMPERATURE
TEMPERATURE (癈)
60
35
10
-15
0.6
0.8
1.0
1.2
1.4
1.6
0.4
-40
85
IRF1310NS
NORMALIZED R
ON
IRFR3910
NORMALIZED R
ON
MAX5938
NORMALIZED V
CB
Figure 15. Circuit-Breaker Voltage Margin For High and Low Tempco Power MOSFETS
CIRCUIT-BREAKER
TRIP REGION
CIRCUIT-BREAKER
TRIP REGION
T
A
 = +25癈
T
A
 = +25癈
I
D
 x R
DS(ON)
V
CB,MIN
V
CB,MIN
I
D
 x R
DS(ON)
R
DS(ON)
 HIGH TEMPCO
R
DS(ON)
 LOW TEMPCO
TEMPERATURE
TEMPERATURE
1/2 x I
CB_ADJ
 x R
CB_ADJ
1/2 x I
CB_ADJ
 x R
CB_ADJ
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